Spin-Injection, Transport, and Localization in Graphene and Group IV Materials
This project explores spin behavior in graphene and related materials to develop new magnetoelectric devices for sensing and information processing.
This grant is no longer accepting proposals
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: Stipends vary by sponsoring agency and location; awards typically last 1 year with possible renewals up to 3 years.
Summary: Supports postdoctoral research on spin-dependent carrier properties in graphene and group IV materials to advance magnetoelectric phenomena and novel device concepts.
Key Information: Open to U.S. citizens and permanent residents holding a doctorate within the last 5 years; research conducted onsite at Naval Research Laboratory (NRL); requires contacting a Research Adviser prior to application.
Description
This fellowship opportunity under the NRC Research Associateship Programs focuses on fundamental research into spin-dependent carrier properties in group IV materials such as graphene, silicon, and germanium. The goal is to deepen understanding of magnetoelectric phenomena in nanostructures to enable advanced sensing, information storage, and processing technologies beyond Moore’s law.
Research areas include:
- Investigating spin lifetimes and scattering mechanisms in graphene and Si-Ge heterostructures.
- Developing novel phenomena like the inverse spin Hall effect for spin control.
- Exploring functionalized graphene as a tunnel barrier and spin-injecting/detecting contact.
- Demonstrating prototype devices such as magnetic tunnel junctions (MTJ), spin-LEDs, and spin-resonant tunneling diodes (spin-RTDs).
- Utilizing transport, optical, and magnetic measurement techniques.
The Naval Research Laboratory (NRL) provides extensive facilities for epitaxial growth, transport and magneto-optical studies, structural and magnetic characterization, and advanced sample fabrication.
