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    Materials Scientist in Atomic Layer Deposition (ALD)

    Seeking a materials scientist with ALD expertise to develop thin film oxides for nanoscale electronic and optical devices, using advanced fabrication and characterization techniques.

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    This grant is no longer accepting proposals

    NRC Research Associateship Programs has archived this opportunity.

    Funder: NRC Research Associateship Programs

    Due Dates: May 1, 2025

    Funding Amounts: $99,200 stipend plus $3,000 travel allowance; relocation and health insurance benefits available.

    Summary: Postdoctoral fellowship for materials scientists with expertise in atomic layer deposition (ALD) to develop thin film oxides for neuromorphic and photonic nanoscale devices at the Naval Research Laboratory.

    Key Information: Open to U.S. citizens and permanent residents; requires Ph.D. earned within last 5 years; research conducted on-site at NRL in Washington, DC.


    Description

    This fellowship opportunity is offered by the NRC Research Associateship Programs at the Naval Research Laboratory (NRL) in Washington, DC, within the Electronics Science & Technology Division. It targets postdoctoral researchers specializing in atomic layer deposition (ALD), a critical technique for depositing uniform, conformal thin film oxides and other materials essential for emerging neuromorphic and photonic applications.

    The research focus includes ALD-grown Mott-transition oxides such as vanadium oxide and niobium oxide, as well as ternary oxide compounds. These materials are studied to achieve tunable properties that support the development of integrated nanoscale electronic and optical devices.

    Candidates should have extensive experience with ALD and a strong materials science background, particularly in analyzing and characterizing electronic thin films. The work involves using a dedicated ALD system, device fabrication techniques (including lithography and reactive ion etching), and advanced materials characterization tools such as X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), X-ray reflectivity (XRR), atomic force microscopy (AFM), and scanning electron microscopy (SEM). Facilities are available both within the division and at the NRL Nanoscience Institute.


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