Synchrotron Radiation Applications
NIST offers research using synchrotron radiation (SURF III) for radiometry, optical properties, microscopy, spectroscopy, and radiation damage studies.
This grant is no longer accepting proposals
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: Stipend approximately $82,764 per year plus $3,000 travel allowance; typical appointment duration 2 years.
Summary: Postdoctoral research fellowships at NIST using synchrotron radiation (SURF III) for studies in radiometry, optical properties, sensor calibration, microscopy, imaging, spectroscopy, and radiation damage.
Key Information: Open to U.S. citizens with a doctoral degree earned within the last 5 years; requires contacting a NIST Research Adviser prior to application; applications accepted only in February and August review cycles.
Description
This fellowship opportunity supports research at the National Institute of Standards and Technology (NIST) in the application of synchrotron radiation using the Synchrotron Ultraviolet Radiation Facility (SURF III). SURF III produces radiation spanning from the far-infrared to the soft x-ray region, with precisely calculable spectral irradiance based on electron beam properties.
Research areas include:
- Radiometry and sensor calibration
- Measurement of optical properties of materials
- Microscopy and imaging techniques
- Spectroscopy applications
- Studies of radiation damage on optical surfaces, components, and materials
The facility features various beamlines for calibration and characterization of optical sensors and radiometric standards, as well as for investigating ultraviolet and extreme ultraviolet optical materials and their degradation under radiation exposure.
The electron beam in SURF III has a circular orbit radius of 0.828 m, an orbital frequency of 56.9 MHz, and electron energy of 380 MeV, producing radiation with a characteristic wavelength of 8.5 nm.
