NIST Submicroscopic Chemical and Physical Characterization of Materials and Particles
NIST is developing analytical methods & standards using electron microscopies & microbeam mass spectrometry for characterizing the chemical & physical properties of submicroscopic materials.
This grant is no longer accepting proposals
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: $82,764 base stipend plus $3,000 travel allowance; typical appointment duration is 2 years.
Summary: Fellowship supporting postdoctoral research at NIST to develop analytical methods and standards for chemical and physical characterization of submicroscopic materials and particles using advanced electron microscopy and microbeam mass spectrometry.
Key Information: Open to U.S. citizens with a doctoral degree earned within the last 5 years; requires contacting a NIST Research Adviser prior to application; NIST participates in February and August review cycles.
Description
This fellowship opportunity at the National Institute of Standards and Technology (NIST) focuses on advancing analytical methods and standards for the chemical and physical characterization of submicroscopic structures and particles. The research targets complex materials such as multilayer films and individual particles ranging in size from micrometers down to approximately 10 nanometers.
Key techniques involved include:
- High-, medium-, and low-voltage electron microscopies
- Microbeam mass spectrometry
- Elemental analysis via energy- and wavelength-dispersive x-ray spectrometry
- Crystallographic characterization using electron diffraction techniques including Electron Backscatter Diffraction (EBSD)
- Elemental and chemical analysis by Auger electron and electron energy loss spectrometry
- Isotopic and elemental analysis of particles by secondary ion and laser microprobe mass spectrometry
The project also aims to develop computer-automated characterization methods that integrate analytical signals from these various instruments.
This research is critical to enabling new technologies that manufacture or utilize nanoscale and submicroscopic materials.
