MEMS-Based Scanning Probe Microscopy
This project aims to improve scanning probe microscopy using MEMS to increase speed and accuracy for nanotechnology manufacturing and semiconductor applications.
This grant is no longer accepting proposals
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: Stipend approximately $82,764 per year plus $3,000 travel allowance; typical appointment duration 2 years.
Summary: Fellowship supporting postdoctoral research to develop MEMS technologies that enhance speed and accuracy in scanning probe microscopy for nanomanufacturing and semiconductor applications.
Key Information: Open to U.S. citizens with a doctoral degree earned within the last 5 years; applications require prior contact with Research Adviser; NIST participates in February and August review cycles only.
Description
This fellowship opportunity supports research at the National Institute of Standards and Technology (NIST) focused on advancing scanning probe microscopy (SPM) through the development of precision microelectromechanical systems (MEMS). The goal is to improve measurement accuracy and throughput in techniques such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM), which are critical tools in nanotechnology but currently limited by scanning speed and area. The research emphasizes miniaturization of sensing mechanisms (e.g., active cantilevers), development of high-speed MEMS scanning stages, advanced motion control, and integration of instrument systems.
Research areas include:
- Design and analysis of MEMS sensors and actuators
- Micro- and nanofabrication techniques
- Control system design and analysis
This work aims to overcome current limitations in SPM to enable its broader use in nanomanufacturing and semiconductor process control.
