Atom | Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope

Funder: NRC Research Associateship Programs

Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025

Funding Amounts: Base stipend approximately $82,764/year with $3,000 travel allowance; typical appointment duration 2 years.

Summary: Postdoctoral fellowship to develop and apply advanced atomic force microscopy techniques for quantitative imaging of bias-induced strain in electronic and energy materials.

Key Information: Open to U.S. citizens with a Ph.D. earned within the last 5 years; research conducted onsite at NIST in Boulder, CO; application requires prior contact with Research Adviser.

Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope

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