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    Heterogeneous Integration for Advanced Microscale Optoelectronic Devices

    Research to develop advanced microscale optoelectronic devices using heterogeneous integration for applications like photovoltaics, flexible electronics, and brain interfaces.

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    This grant is no longer accepting proposals

    NRC Research Associateship Programs has archived this opportunity.

    Funder: NRC Research Associateship Programs

    Due Dates: May 1, 2025 (Next deadline)

    Funding Amounts: Stipend approximately $99,200 per year plus $3,000 travel allowance; relocation assistance available for eligible awardees.

    Summary: Postdoctoral fellowship supporting research on heterogeneous integration techniques for advanced microscale inorganic optoelectronic devices with applications in photovoltaics, flexible/biocompatible electronics, and brain-computer interfaces.

    Key Information: Open to U.S. citizens and permanent residents; requires Ph.D. earned within last 5 years; research conducted onsite at Naval Research Laboratory in Washington, DC.


    Description

    This fellowship opportunity supports research at the Naval Research Laboratory (NRL) focused on heterogeneous integration techniques for advanced microscale inorganic optoelectronic devices. The research aims to develop novel device architectures by mechanically stacking optoelectronic devices grown on dissimilar templates. Applications include:

    • Higher performance stacked III-V photovoltaic devices
    • Alternative III-V substrates with reduced cost or enhanced properties
    • Flexible and biocompatible optoelectronics for wearable and implantable biological devices
    • Multi-site, non-destructive brain-computer interface electronics with discrete read/write capabilities

    The program seeks applicants interested in microscale optoelectronic device fabrication, micro-transfer printing for stacked devices, optoelectronic assembly in flexible/biocompatible packaging, molecular beam epitaxy (MBE) As/P epitaxial growth, neuroengineering, and materials/device characterization.

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