Research to create new electrical tests for advanced electronic devices, using combined methods to predict device reliability in demanding applications.
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: Base stipend approximately $82,764/year with $3,000 travel allowance; typical appointment duration 2 years.
Summary: Postdoctoral fellowship to develop innovative electrical test methodologies for advanced nanoelectronic solid-state devices to predict and improve device reliability in critical applications.
Key Information: Open to U.S. citizens with a doctoral degree earned within the last 5 years; research conducted on-site at NIST in Gaithersburg, MD; requires prior contact with research advisers.
This fellowship opportunity supports research focused on the reliability and resiliency of advanced nanoelectronic solid-state devices, which are fundamental to modern technology. While device reliability is less critical in consumer electronics, it poses significant challenges in automotive, high-performance computing, and medical electronics sectors where failure is not an option.
The research aims to develop novel electrical test methodologies that combine established device measurements with ultra-fast electrical characterizations. These methods will simulate specific device circuit environments to better understand the defect physics that govern device failure and enable accurate end-of-life predictions. The project covers a broad range of device structures, including exotic transistors with novel materials and resistive random access memories, with the goal of creating microscopic models to predict device operation and reliability.
The fellowship is hosted by the Physical Measurement Laboratory, Nanoscale Device Characterization Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD.