Structures of Thin-Film Hydrogen-Storage and Hydrogen-Containing Materials
Neutron reflectometry is used to measure hydrogen depth profiles in storage materials and devices to study hydrogen's effects on material properties.
This grant is no longer accepting proposals
NRC Research Associateship Programs has archived this opportunity.
Funder: NRC Research Associateship Programs
Due Dates: February 1, 2025 | May 1, 2025 | August 1, 2025 | November 1, 2025
Funding Amounts: Stipend approximately $82,764 per year plus $3,000 travel allowance; typical appointment duration 2 years.
Summary: Postdoctoral fellowship to conduct neutron reflectometry research on hydrogen depth profiles in thin-film hydrogen-storage and hydrogen-containing materials at NIST.
Key Information: Open to U.S. citizens holding a doctoral degree within the last 5 years; applications require prior contact with research advisers; NIST participates in February and August review cycles only.
Description
This postdoctoral research opportunity at the National Institute of Standards and Technology (NIST) focuses on the use of neutron reflectometry to study thin-film hydrogen-storage and hydrogen-containing materials. Neutron reflectometry is highly sensitive to hydrogen and deuterium, enabling precise measurement of hydrogen depth profiles in storage materials and devices. Research topics include investigating how hydrogen affects magnetic order, electronic properties, and optical characteristics of these materials.
The fellowship is part of the NRC Research Associateship Programs (RAP), which provide promising scientists with high-quality research experiences at federal laboratories. Awardees will work at the NIST Center for Neutron Research in Gaithersburg, MD, collaborating with expert advisers and accessing state-of-the-art facilities.
